PROFILOMETERS INTRO
 
  Nanovea 3D Non-Contact Profilometers are designed with leading edge white
  light axial chromatism technology to obtain higher resolution surface texture
  measurements, quicker 3D metrology and more precise thickness mapping on a
  wider range of geometries and materials than any other Profilometer.
  With the use of a large range of Optical Pens the Nanovea Profilometers are
  able to obtain superior results on a wide range of applications.

PROFILOMETERS

 ST400 Optical Profiler
  The flexible, modern design of the ST400 includes: 150mm X-Y stages and a
  large coarse height adjustment to easily accommodate larger sample sizes.
  The ST400 also has an optional offset camera, with either manual or motorized
  zooms, to easily identify small features prior to measuring them. The Custom
  Profiler, a more open configuration, allows for the addition of larger X-Y stages
  to measure even larger areas, a 3600 rotational stage for measuring spherical or
  cylindrical parts, and many other custom configurations.

 PS50 Optical Profiler
  The PS50 was designed with table space and overall price in mind. Using the
  same technology and software as the ST400, along with 50mm X-Y stages,
  the high-perfomance PS50 is the ideal choice to replace stylus and laser profilers.
  The PS50 has a small footprint (30cm x 25cm) and the option of runnin on a
  laptop, which makes for an easy installation where space is critical.

 Customized Optical Profiler
  Nanovea's team of engineers have accepted many customized projects including
  a Clean Room "Class1" component capable Profiler with a custom motorized
  stages for precise flatness measurement. They have also provided a custom built
  high-speed Profiler with speeds over 30,000 points/second and machine vision
  with image recognition to improve efficiency. Additionally, Profilers have been
  built with custom scanning capabilities to acquire surface measurements from
  both the top and bottom surfaces while measuring the thickness of the material,
  all with nanometer resolution.

AXIAL CHROMATISM PRINCIPLE

 Process:
  The technique uses a ray of white light that passes through a lens
  containing a high-degree of chromatic abberation, creating a
  wavelength coded vertical measurement range. The image results
  from a specific, focused wavelength which is reflected back from the
  surface being measured. If the surface is composed of transparent
  or semi-transparent layers, the technique will be able to
  simultaneously measure two surfaces, as well as the thickness of the
  layer. Some benefits associated with axial chromatism include:

 Benefits:
  • Zero influence from sample reflectivity variations
  • No sample preparation
  • Ability to measure high surface angles
  • Large Z measurement range
  • Measure all materials; transparent/opaque, specular/diffusive,
     polished/rough
  • Excellent vertical and spatial resolution

PROFILOMETERSS HARDWARE OPTIONS

  • Video Microscope with Turret
  • Turret for Optical Pens
  • High Speed X-Y Stages (up to 1m/s)
  • High Speed Optical Sensor (up to 30KHz)
  • AFM Objective
  • Near-IR Interferometric Sensor
  • 900 Pens for Inner Bore Measurements.

SOFTWARE INTRO

 Nanovea 3D Software
  The Nanovea 3D software is the acquisition software that is used with all Nanovea
  Profliers. The software permits the user to define the size of the area, or line, to
  be measured, as well as the lateral resolution of the measurement. The software
  also allows three different views of the measurement in real-time:
  cross-sectional, top-down and 3-dimensional views. To make it easier to find and
  measure small surfaces, a re-centering function allows the user to point-and-
  click on the scanned image in order to re-center the next scan to that specific
  point; or by use of a point-and click feature from an optional offset video camera.

 Mountains 3D Analysis Software
  Optional software package available to all Nanovea Profi lers, which provides
  a complete set of surface analysis tools. Some of these functions include:

  • User-friendly report making and editing
  • An extensive list of roughness, flatness, waviness and other surface
     parameters
  • Create 3D images in false color, contour maps and photo simulation
  • A variety of filtering, leveling and other surface correction functions
  • Ability to create templates to be applied to multiple individual measurements
  • Dimensional analysis, surface area, volume, bearing ratio and texture direction
  • Grain counting, sorting, and other grain analysis
  • Spectral analysis, autocorrelation, and fractal analysis
  • Statistical analysis over a population of results
  • Ability to export raw data, images, and entire reports
  • Create and export .. y-over videos of the surface
  • 4D analysis to look at surface changes, as a function of time
  • Motif analysis
  • Additional functions available, please check with us for more details

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